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JEOL JXA-8530F Hyperprobe

JEOL JXA-8530F Hyperprobe

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JEOL JXA-8530F Hyperprobe

The hyperprobe JXA-8530F is the second generation of JEOL electron beam microprobes, which, thanks to a Schottky field emission source, helps to advance the application ranges for microanalysis. For the JXA-8530F, the electron optics and the vacuum system have been redesigned and radically improved. This means, that a significantly smaller beam diameter is available especially for micro analyses at low acceleration voltages.

Analyses reaching deep into the sub-micron range, analyses at sensitive specimen, high resolution images under analysis conditions become reality with the Hyperprobe JXA-8530F. As with the JXA-8230, the device can be equipped with 1 - 5 crystal spectrometers (WDS) as well as an additional EDS system. Three different spectrometer types with special crystals are available for the combination of virtually any application.

  • XCE spectrometer with two crystals and high spectral resolution
  • XCE-FCS spectrometer with 4 crystals and high spectral resolution
  • H-type spectrometer for high intensities and fast mapping

An integrated optical microscope (OM) with TV camera and a variety of specimen stages allows for simple analysis, even of large specimen. The convenient software simplifies even complex analyses as well as the imaging of the obtained results

Specifications

Electron optics

Electron source

Field emission with in-lens Schottky emitter

Acceleration voltage

1 to 30 kV

Specimen current

10-11 to 5•10-7 A

Beam current stability

±0.3% / h

Resolution in SE image

3 nm

Minimum beam diameter

40 nm at 10-8 A, 100 nm 10-7 A (10 kV)

Magnification

x40 to x300,000

 
 
Analysis system

Number of spectrometers

1 to 5

Detectable element range

5B to 92U (optional: Be to U)

Wavelengths range

0.087 to 9.3 nm

 
 

Options (selection)

  • EDS system
  • Specimen stages for large and very large specimen
  • Auto-focus for the optical microscope
  • Transmission illumination for the optical microscope
  • Software for spectral de-convolution, thin film analysis,
    particle analysis, and other uses
  • EBSD
  • Cathode luminescence

Please note:

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

 

Call Back Service

Do you have any questions concerning our JEOL JXA-8530F Hyperprobe? Please feel free to use the following form – we will get back to you within a working day.

 
 
 
 
 

Contact, dates and things to know

Contact

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH
Gute Änger 30
DE-85356 Freising · Germany
Phone: +49 8161 9845-0
Fax: +49 8161 9845-100
E-mail: info@jeol.de


JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB
Hammarbacken 6A
SE-19127 Sollentuna · Sweden
Phone: +46 828 2800
Fax: +46 829 1647
E-mail: info@jeol.se


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Contact

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH
Gute Änger 30
D-85356 Freising · Germany
Phone: +49 8161 9845-0
Fax: +49 8161 9845-100
E-mail: info@jeol.de

JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB
Hammarbacken 6A
SE-19127 Sollentuna · Sweden
Phone: +46 828 2800
Fax: +46 829 1647
E-mail: info@jeol.se

Global website

Global website

External link to website www.jeol.com

JEOL ARM-owner-group

External link to Website www.jeol-arm.eu