JEOL - Focused Ion Beam Systems (FIB)

JEOL Focused Ion Beam Systems (FIB)

Based on the proven JEOL electron and ion optical devices, JEOL developed FIB systems providing the opportunity to produce fast and precise cross section specimen for TEM and SEM applications.

There are not only systems available with an ion source for preparation and imaging, but also two beam devices which feature a combined electron column and FIB source. Effective software packages for the automated FIB preparation as well as for FIB tomography complete the JEOL FIB product line.

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Models:

For additional product information, please select a model from the following list.

  • JEOL JIB-4000 (Single Beam FIB-System)

    JEOL JIB-4000 (Single Beam FIB-System)

    The JIB-4000 focused ion beam system is a state-of-the-art, high-resolution, digital focused ion beam system with newly designed ion optics and an intuitive, graphic user interface (GUI). The JIB-4000 can be used for thin film cuts for STEM/TEM and ...

  • JEOL JIB-4700F Multi Beam System

    JEOL JIB-4700F Multi Beam System

    JEOL has developed the JIB-4700F Multi Beam System to be used for morphological observations, elemental and crystallographic analyses of a variety of specimens.

 
 

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

Contact, dates and things to know

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JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH
Gute Änger 30
DE-85356 Freising · Germany
Phone: +49 8161 9845-0
Fax: +49 8161 9845-100
E-mail: info@jeol.de


JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB
Hammarbacken 6A
SE-19127 Sollentuna · Sweden
Phone: +46 828 2800
Fax: +46 829 1647
E-mail: info@jeol.se


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Second-hand Equipment

 
JEM-1010
The JEM-1010 is a cost-effective and powerful high-resolution electron microscope with an acceleration voltage up to 100 kV.
JEM-1400Plus
Transmission Electron Microscope JEOL JEM-1400Plus from our applications laboratory.
IB-19510CP
Easy-to-operate preparation system for the production of specimen cross-sections for SEM, EPMA and auger applications.
JSM-7800F PRIME
Extreme-resolution Analytical Field Emission SEM. JEOL JSM-7800F PRIME from our applications laboratory.
 
 
 

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External link to Website www.jeol-arm.eu

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Contact

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH
Gute Änger 30
D-85356 Freising · Germany
Phone: +49 8161 9845-0
Fax: +49 8161 9845-100
E-mail: info@jeol.de

JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB
Hammarbacken 6A
SE-19127 Sollentuna · Sweden
Phone: +46 828 2800
Fax: +46 829 1647
E-mail: info@jeol.se

Global website

Global website

External link to website www.jeol.com

JEOL ARM-owner-group

External link to Website www.jeol-arm.eu