Electron- and Ion-Optics

As one of the top manufacturers of scientific instruments, JEOL offers a wide variety of electron optics products for a broad range of applications. JEOL’s main product line and one of its core competencies, electron microscopes, have helped advance scientific and industrial research since the 1940s.

Today’s generation of electron microscopes deliver extremely high resolution for nanotechnology research and unprecedented quality for imaging fine surface details, analyzing biological and fabricated samples at the atomic level, and seeing microscopic details as they really are, magnified hundreds of thousands of times. Easy to use, flexible for a variety of applications, and backed by JEOL’s award-winning support, JEOL electron microscopes play an influential role in the development of new products and materials, analysis for quality control and forensic investigations, biological research, materials characterization, and more.

Electron- and Ion-Optics

Transmission Electron Microscopes (TEM)
Scanning Electron Microscopes (SEM)
Electron Beam Microprobe Analyzers (EPMA)
Auger Micro Probes
Focused Ion Beam Systems (FIB)
X-ray Analytics
SEM and TEM Specimen Preparation Systems