JEOL JSM-IT300HR InTouchScope™
JEOL JSM-IT300HR InTouchScope™
The JSM-IT300HR is the latest addition the high appreciated and award-winning JEOL InTouchScope SEM family. By implementing a new high-brightness field emission electron gun as well as a fully integrated JEOL EDS system the JSM-IT300HR clearly outperforms the competition in imaging and analytical capabilities.
Designed and crafted with a multi-user environments in mind, the new JSM-IT300HR combines highest performance with an outstanding ease of use.
Features
High resolution scanning electron microscope with JEOL patented “High Brightness” field emission electron gun (FEG)
- New high-brightness field emission electron gun and optical system, providing high resolution imaging and high spatial resolution analysis.
- Fully integrated and automated low vacuum system.
- Streamlined and intuitive operation is enabled by touch panel functionality. Improved automation and recipe functions allow fastest results and maximum through-put, in multi-user laboratories.
- Easy-to-use graphical software interface includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
- Large specimen stage to accommodate various sample sizes. Fastest chamber pumping times and an additional air-lock system* result in a perfect transfer solution even for the most sensitive of samples.
- Small footprint and modest room installation requirements similar to conventional general-purpose SEMs.
* Optional
Options
JEOL fully integrated EDS Detector
Specifications
Accelarating voltage | 0,5 kV - 30 kV |
Resolution (HV) | 1,5 nm (30kV), 4,0 nm (1kV) |
Resolution (LV) | 1,8 nm (15kV, BED) |
Low vacuum | Bis 150Pa |
Magnification | 5x to 600.000x |
Large analytical chamber | 340mm Durchmesser |
Please note:
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.