JEOL - Systems for X-ray Fluorescence Analysis (RFA)

Systems for X-ray Fluorescence Analysis (RFA)

JEOL is one of the largest manufacturers of energy dispersive X-ray analysis systems and also offers powerful systems for X-ray fluorescence analysis.


X-ray fluorescence analytics is used for the highly sensitive detection and quantification of elements. The systems are also qualified for the analytics of elements, which were restricted based on the RoHS directive (e.g. Cd and Pb).

 

Models:

For additional product information, please select a model from the following list.

  • JEOL JSX-1000S ElementEye™

    JEOL JSX-1000S ElementEye™

    The JSX-1000S is our latest development in benchtop energy dispersive X-ray fluorescence spectrometers. It has a sophisticated new design built for easy operation, high throughput and improved sensitivity.

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

 
 
 
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Exhibition Dates

  • Gefüge und Bruch

    08.04. - 10.04.2015 in Leoben, Austria

    Montanuniversität Leoben

  • Finnish NMR Symposium

    15.04. - 16.04.2015 in Kuopio, Finland

    University of Eastern Finland

  • 8th NTNU – EBSD workshop 2015

    22.04. - 23.04.2015 in Alfred Getz vei 2, 7491 Trondheim, Norway

    Department of Materials Science and Engineering, Department of Geology and Mineral Resources Engineering