JEOL - Systems for X-ray Fluorescence Analysis (RFA)

Systems for X-ray Fluorescence Analysis (RFA)

Systems for X-ray Fluorescence Analysis (RFA)

JEOL is one of the largest manufacturers of energy dispersive X-ray analysis systems and also offers powerful systems for X-ray fluorescence analysis.


X-ray fluorescence analytics is used for the highly sensitive detection and quantification of elements. The systems are also qualified for the analytics of elements, which were restricted based on the RoHS directive (e.g. Cd and Pb).

JSX-3100RII
State-of-the-art, high-performance and easy-to-operate element analysis system for the qualitative and quantitative element analytics, in accordance with RoHS specifications. Electronically cooled, maintenance-free Si(Li) detector with a detection range from sodium to uranium.

JSX-3100RII

JSX-3400RII
State-of-the-art, high-performance and easy-to-operate element analysis system for the qualitative and quantitative element analytics, in accordance with RoHS specifications. Detection range: Sodium to uranium.

JSX-3400RII

Please note:

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

 
 
 

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Exhibition Dates

  • Scandem 2014

    11.06. - 13.06.2014 in Linköping, Sweden

    City Center Linköping

  • EMLC 2014

    24.06. - 25.06.2014 in Dresden, Germany

    Hilton Hotel

  • Euromar 2014

    29.06. - 03.07.2014 in Zürich, Swiss

    ETH Zurich