JEOL is known worldwide as a manufacturer of electron-optical equipment and has been operating successfully in this field since 1949.
In recent years JEOL has also expanded its activities into other segments and now offers high-performance systems along the following product spectrum:
Transmission Electron Microscopes (TEM)
Scanning Electron Microscopes (SEM)
Electron Beam Microprobe Analyzers (EPMA)
Auger Micro Probes
Focused Ion Beam Systems (FIB)
X-ray Analytics
SEM and TEM Specimen Preparation Systems
Electron Beam Lithography Systems
Wafer and Mask Inspection Systems
CD Measurement Systems for Masks
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.
63rd annual meeting of SCANDEM, the Nordic microscopy society
Annual international conference on Magnetic Resonance
Conference on Diagnostic Microscopy Basic Research & Oncology, located at the University Medical Center in Regensburg, Germany
© 2011 JEOL (Germany) GmbH. All rights reserved. Implementation: K-3D Graphic