A selection of JEOL second-hand equipment is listed below.
Please contact us if you have questions about specific instruments or prices.
Scanning electron microscope
High resolution scanning electron microscope with JEOL patented “High Brightness” field emission electron gun (FEG)
Transmission Electron Microscope JEOL JEM-1400Plus from our applications laboratory.
Easy-to-operate preparation system for the production of specimen cross-sections for SEM, EPMA and auger applications.
JEOL Cross section polisher IB-19510CP from our applications laboratory
Improvements to facilitate fast and easy processing of a wide range of materials include:
The JEM-1010 is a cost-effective and powerful high-resolution electron microscope with an acceleration voltage up to 100 kV.
We are happy to answer your questions at no charge and free of
obligation and can offer consulting on upcoming projects.
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