20.05.2024
During this three-day event in June (18-20), you will participate in live FIB and TEM demonstrations and sessions with resident experts. No registrations fees!
Join Gatan, JEOL, and the Technical University of Munich (TUM) for our upcoming workshop on transmission electron microscopy (TEM) sample preparation, electron counting imaging methods, and analytical microscopy. During this event, you will spend time with leading experts from academia and industry to explore the new possibilities in automated sample preparation and to advance your practical skills necessary to move your routine and advanced TEM and electron energy loss spectroscopy (EELS) studies forward.
Presentations from expert users will be complemented by live-demos with application specialists from Gatan and JEOL, showcasing these techniques on JEOL’s new focused ion beam (FIB) PS500i and the analytical F200 located at the TUM, featuring direct detection and in-situ EELS, energy-filtered 4D STEM, and many more capabilities.
During this three-day event, you will participate in live FIB and TEM demonstrations and sessions with resident experts. Participants are encouraged to send samples which may be considered for analysis before, during, or after the workshop.*
Registration and catering for this in-person event are free, but seats are limited.
*Samples may be considered for evaluation as part of this workshop. Interested attendees should contact training@jeol.de by 31 May for consideration.