The new field emission Auger probe JAMP-9510F, with 8 nm, offers the best lateral analytical resolution worldwide. In addition, the resolution of 3 nm in imaging mode highlights the benefits of a field emission beam source as compared to conventional LaB6 sources.
The JAMP-9510F achieves very small beam diameters at very high beam currents of up to 500 nA by using a low aberration condenser lens with the overlay of an electro-static field and a magnetic field, combined with a patented "in-lens" Schottky field emission source.
With the JAMP-9510F, a state-of-the-art ion source is for the first time being used for fast de-sputter and also for the neutralization of charges. This new ion source makes analysis of insulating specimen easy.
The JAMP-9510F is destined to produce high-resolution SEM images, Auger images, line profile analyses and depth profile analyses even during ion etching.
The electron spectrometer is an electrostatic, semi-spherical analyzer (HAS) with a multi-channel detector, optimally designed for Auger analyses, i.e. optimal energy resolution without loss of sensitivity.
A user-friendly and simple control system, along with flexible optional equipment, rounds the system out and makes the JAMP-9510F a universal device.
Field emission source (in-lens Schottky)
0.5 to 30 kV
10-12 to 5 · 10-7 A
Specimen current measurement
either Faraday cup or specimen stage, selectable
Hemispherical, electrostatic analyzer
Multi-channel detection with channeltrons, seven channels
≥ 840,000 cps (7 channels)
Pressure in the analysis chamber
≤ 5 · 10-8 Pa (optional: ≤ 1.3 x 10-8 Pa)
X: -48 mm to +10 mm
Y: ± 10 mm
Z: ± 6 mm
T: 0 to 90°
R: 360° (endless)
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.