Advances in the development of new materials featuring complex nanostructures increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed the JIB-4700F Multi Beam System to be used for morphological observations, elemental and crystallographic analyses of a variety of specimens.
The JIB-4700F features a hybrid conical objective lens, GentleBeam mode and an in-lens detector system to deliver a resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an in-lens Schottky-FEG that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA probe-current is employed for fast ion milling and processing of specimens.
Concurrent with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a three-dimensional analysis function that automatically captures SEM images at certain intervals in cross-section processing is provided as one of the JIB-4700F's standard features.
0.1 to 30.0kV
1.2nm (15kV, GB mode)
x20 to 1,000,000
1pA to 300nA
Detector (*: option)
LED, UED, USD*, BED*, TED*, EDS*
Computerized 6-axis goniometer stage
1 to 30kV
x50 to 300,000
1 pA to 90 nA, 13 steps