New Benchtop SEM JCM-6000Plus NeoScope™ - Equipped with a high-sensitivity semiconductor detector, delivering efficient analysis.
Scanning electron microscopes are being utilized in an expanding range of fields, such as medicine, biology, nanotechnology, metals, semiconductors, and ceramics. In addition, the applications cover a wide spectrum, from basic research to quality control at the manufacturing site.
The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification.
x10 to x60,000
High-vacuum/ Secondary electron image, Backscattered electron image (composition, topography, shadow),
5kV／10kV／15kV (3 stages)
Small gun with integrated filament / Wehnelt
Manual control, 2-axis stage
Full-auto, Auto-focus, Auto-stigma, Auto-contrast & brightness,
Via touch panel and mouse operation
Digital image display
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.