The JSM-IT510 is a new model of JEOL InTouchScope™ series.
Equipped with our sophisticated Analytical series, the JSM-IT510 facilitates any analyses from specimen loading to report generation.
JSM-IT510 series can be equipped as follows:
Resolution | HV mode : 3.0 nm (30 kV) 15.0 nm (1.0 kV) |
Direct magnification | x 5 to x 300,000 |
Displayed magnification | x 14 to x 839,724 |
Electron gun | Tungsten (W) filament |
Accelerating voltage | 0.3 kV to 30 kV |
Probe current | 1 pA to 1 μA |
LV pressure adjustment | 10 to 650 Pa |
Automatic functions | Filament adjustment, Gun alignment, |
Maximum specimen size | 200 mm diameter, 90 mm height |
Specimen stage | Large eucentric type |
Standard recipe | Built-in (includes EDS conditions) |
Image modes | Secondary electron image, REF image, |
EDS functions | Spectral analysis, Qualitative & Quantitative analysis, |
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.