Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves maximum probe current of more than 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.
1.6 nm (at accelerating voltage 1 kV),
×10 to ×1,000,000
Secondary electron image, Backscattered electron image, Transmitted electrons (optional)
0.01 to 30 kV
1 pA to > 300 nA
In-lens Schottky field emission gun
5-axis motor drive stage
X: 70 mm Y:50 mm, Z: 2.0 to 41 mm
Specimen exchange chamber
Included in the standard configuration
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.