Scanning Electron Microscopes (SEM)

New Field Emission Scanning Electron Microscope JEOL JSM-7200F – Multi-purpose FE-SEM combining high-resolution and easy operation

Products
Features
Specifications
Pictures
Info

JEOL JSM-7200F – Multi-purpose FE-SEM combining high-resolution and easy operation

Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves maximum probe current of more than 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.

Features

  1. High resolution
    High resolution of 1.6 nm (at 1 kV), 1.2nm (at 30kV)

  2. High-speed analysis
    Maximum probe current of more than 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution.

  3. Energy signal differentiation
    Incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies.

  4. Wide area analysis
    The LDF (large depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage)

Specifications

Resolution

1.6 nm (at accelerating voltage 1 kV),
1.2 nm (at accelerating voltage 30 kV)
3.0 nm (at accelerating voltage 15 kV, WD 10 mm,
probe current 5 nA / Analysis condition)

Magnification

×10 to ×1,000,000

Imaging modes

Secondary electron image, Backscattered electron image, Transmitted electrons (optional)

Accelerating voltage

0.01 to 30 kV

Probe current

1 pA to > 300 nA

Electron gun

In-lens Schottky field emission gun

Motor control

5-axis motor drive stage

Stage movement

X: 70 mm Y:50 mm, Z: 2.0 to 41 mm
Tilt: – 5 to 70°, Rotation: 360° endless

Specimen exchange chamber

Included in the standard configuration

Please note:

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

Contact Form

We are happy to answer your questions at no charge and free of obligation and can offer consulting on upcoming projects. Please use the following contact form (* = mandatory field) for your questions.

Choose Contact type*

Your Contact details*



News from JEOL


Message to JEOL

Disclosure of personal data to third parties

This website uses services that collect personal data in order to provide social media features and to analyse our traffic. These services include Google Maps (for the display of our location) and Google Analytics (for local website analysis). These integrated services might merge the personal data with further data. Further information on the used cookies and withdrawal can be found in our data privacy statement.
Your consent is voluntary, not necessary for using the website and can be withdrawn anytime.
You can accept or decline the transfer and processing of data by the following services.

I have read and understood the notes on privacy. I agree to the transfer and storage of my data according to the data privacy statement. I know that I have the right to withdraw this consent at any time without giving any reason, without affecting the lawfulness of the data processed after my consent and until withdrawal.