The JSM-7900F Field Emission SEM is a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis. This tool excels in lightning fast data acquisition through simple and automated operation.
Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens.
At the heart of this premier microscope is the new electron optical system, NeoEngine, that significantly enhances alignment accuracy, optimizes probe diameter at all conditions, and simplifies observation for all levels of operators.
A powerful new navigation system, Smile Navi, guides the operator through the data acquisition process. The novice can master basic SEM operation steps and an online training guide provides comprehensive support.
0.6 nm (15 kV), 0.7 nm (1.0 kV), 1.0 nm (0.5 kV)
×25 to ×1,000,000
In-lens Schottky plus field emission electron gun
0.01 kV to 30 kV
A few pA to 500 nA
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.