JEOL JSM-IT700HR InTouchScope™
JEOL JSM-IT700HR InTouchScope™
Built off of the highly successful predecessor of our InTouchScope™ series SEMs, the JSM-IT700HR was developed to meet increasing demands in the market place. This new SEM breaks through the conventional general-purpose SEM in terms of high resolution imaging and high spatial-resolution analysis, by incorporating a new high-brightness electron gun. Furthermore, integration of JEOL’s energy dispersive X-ray spectrometer (EDS) into the JSM-IT700HR allows for seamless acquisition from image collection to elemental analysis.
The JSM-IT700HR adopted our Multi Touch Operating System that has been highly regarded in our InTouchScope™ series. The touch screen interface incorporates various automatic functions.“Specimen Exchange Navi”enables acquisition of high-quality data without complicated condition setup and area search.
The JSM-IT700HR integrateshigh performance with unprecedented ease of use, enabling dramatically improved work efficiency.
Features
We proudly introduce a new addition to our JEOL InTouchScope™ series SEMs, the JSM-IT700HR.
Increase your productivity with our fully-integrated software, from specimen navigation to analysis to report creation.
This state-of-the-art SEM, with its high-brightness electron gun system, provides amazing high-resolution imaging along with high sensitivity and high spatial resolution analysis at even faster speeds.
- "Zeromag" function links holder graphics, CCD and SEM images to simplify sample navigation.
- "Live Analysis", our embedded EDS system, shows real time EDS spectra during image observation for efficient elemental analysis.
- SMILE VIEW™ Lab, enabling integrated management of image and analysis data, facilitates report generation for all data "Specimen Exchange Navi" enables safe and simple specimen exchange.
- With the newly-developed Auto Beam Alignment function, the electron optical conditions are always kept optimum.
- Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
- Compact design with small footprint.
Options
- Low Vacuum Secondary Electron Detector (LSED)
- Energy Dispersive X-Ray Spectrometer (EDS)
- Wavelength Dispersive X-Ray Spectrometer (WDS)
- Electron Backscatter Diffraction Detector (EBSD)
- Load Lock Chamber (pre-evacuation chamber)
- Stage Navigation System (SNS)
- Chamber Scope (CS)
- Operation Panel
- 3D Measurement Software
Specifications
Resolution
(HV) |
1.0 nm (30 kV); 3.0 nm (1.0 kV) |
Resolution (Analysis) |
3.0 nm (15 kV, Probe current 3 nA) |
Resolution
(LV) | 1.8 nm (15 kV BED) |
Direct
magnification |
x 5 to
x 600,000 |
Electron
gun |
High
brightness electron gun |
Accelerating
voltage |
0.5 kV to
30 kV |
Probe
current | few pA to 300 nA |
LV
pressure adjustment | 10 to 150
Pa |
Automatic
functions | Filament
adjustment, Gun alignment, |
Maximum
specimen size | 200 mm
diameter, 75 mm height |
Specimen
stage | X: 125
mm Y: 100 mm Z: 80 mm |
Image
modes | Secondary
electron image, REF image, Compositional image,Topographic image, Stereo-microscopic image |
Please note:
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.