JEOL IB-19520CCP Cryo Cross Section Polisher

Product

Features

Specifications

Pictures

Info

JEOL IB-19520CCP Cryo Cross Section Polisher

JEOL offers a Cooling Cross Section Polisher for preparation and polishing of materials that are sensitive to exposure to air or thermal damage, such as solder, metallic lithium, and galvanized steel. The CCP allows long cooling periods while conserving liquid nitrogen. An isolation and transfer system allows processing to be performed without exposure to air.

Features

Clean polished cross section of hard, soft, and composite materials
Clean mirrored surface with minimal strain or distortion
Wide area cross sections (up to several mm across)
Easy touch panel operation
Nitrogen cooling prevents thermal damage to materials with low melting and low glass transition points
Air Isolation transfer system protects samples that are sensitive to exposure

Specifications

Ion accelerating voltage	2～8kV
Milling speed	500μm/h
Max. specimen size	11mm (W) x 10mm (L) x 2mm (T)
Auto modes	Processing is automatically started once a preset pressure value is reached. Auto stop function integrated
Intermittent mode	Pulse-controlled ion beam radiation reduces ion beam specimen exposure during processing
Finishing mode	Fine surface finish milling is automatically started once processing is completed

Please note:

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

Contact Form

We are happy to answer your questions at no charge and free of obligation and can offer consulting on upcoming projects. Please use the following contact form (* = mandatory field) for your questions.

Choose Contact type*

Contact type*

telephone e-mail mail

Your Contact details*

Title

Mr. Ms.

Degree

First Name*

Name*

Company / University / Academy*

Street*

Zip Code*

City*

Country*

Telephone

e-mail*

News from JEOL

Declaration of Consent

I agree to receive information on the following areas until further notice.

Areas of interest

Scanning Electron Microscopes (SEM) Focused Ion Beam Systems (FIB) Transmission Electron Microscopes (TEM) Sample Preparation Systems (SEM / TEM) Electron Probe Microanalyzers (EPMA) Auger Spectroscopy X-ray Photoelectron Spectroscopy (XPS/ESCA)

Electron Beam Lithography Systems X-ray Fluorescence Spectroscopy (XRF) NMR Spectrometer Mass Spectrometry Analytical Services Events / Trainings Others

Message to JEOL

Notification

Data privacy statement*

I have read and approved the data privacy statement.

Bitte nicht ausfüllen

Disclosure of personal data to third parties

This website uses services that collect personal data in order to provide social media features and to analyse our traffic. These services include Google Maps (for the display of our location) and Google Analytics (for local website analysis). These integrated services might merge the personal data with further data. Further information on the used cookies and withdrawal can be found in our data privacy statement.
Your consent is voluntary, not necessary for using the website and can be withdrawn anytime.
You can accept or decline the transfer and processing of data by the following services.

Google Analytics Cookies

Google Maps Cookies

I have read and understood the notes on privacy. I agree to the transfer and storage of my data according to the data privacy statement. I know that I have the right to withdraw this consent at any time without giving any reason, without affecting the lawfulness of the data processed after my consent and until withdrawal.