The JEM-1400Flash is used in a wide range of fields, such as biology, nanotechnology, polymer, and advanced materials research. In order to increase the ease of use and as well as to support higher-throughput imaging, JEOL has released a new 120 kV electron microscope, the JEM-1400Flash. Equipped with a seamlessly integrated high-sensitivity sCMOS camera, a new ultra-wide area panorama system and a new correlative microscopy function, the JEM-1400Flash once more pushes the boundaries of electron microscopy.
0.2 nm (HC) 0.14 nm (HR)
10 to 120 kV
×10 to ×1,200,000 (HC), ×10 to ×1,500,000 (HR)
Max. tilt angle
±70° *With the optional high tilt specimen holder
Number of specimens to load
Up to 4 *With the optional specimen quartet holder
Oil-free pumping system for the elctron optical column
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.