Transmission Electron Microscopes (TEM)

JEOL JEM-1400Plus Transmission Electron Microscope

Product
Features
Specifications
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Info

JEOL JSM-1400Plus Transmission Electron Microscope

The JEM-1400Plus is a newly developed high performance TEM with LaB6 cathode and a programmable five-axis motozrized specimen stage. The maximum acceleration voltage of this microscope is 120 kV. There are two different objective pole pieces available for the JEM-1400Plus: A high contrast pole piece for optimum specimen contrast with superb brightness and resolution, and a STEM pole piece for the combined TEM/STEM mode.

Features

  • User-friendly interface with many automated functions
  • Intuitive user guide for new users via touchscreen or mouse
  • Function oriented expert mode
  • Multiple user login
  • Remote control through network
  • Completely rotation-corrected lens system
  • Minimum dose system

Specifications

Electron optics

Electron source

W- or LaB6 emitter (optional)

Acceleration voltage

40 to 120 kV

Point resolution

0.38 nm

Line resolution

0.20 nm

Magnification range

x200 bis x1.200,000 (HC pole piece)
x5,000 bis x2,000,000 (STEM pole piece)

Low Magnification Mode

x10 bis x1.000 (HC pole piece)
x120 bis x4.000 (STEM pole piece)

Specimen stage

Type

Side-entry goniometer

Stage movement

X: ±1 mm
Y: ±1 mm
Z: ±0.5 mm
T: ±70°

Options (selection)

  • LaB6 cathode
  • STEM detector and HAADF detector
  • Tomography system
  • Cryo systems
  • CCD camera
  • EDX systems

Please note:

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

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