"NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.
"NEOARM" is also equipped with an automated aberration correction system COSMO that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging.
Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit. Contrast enhancement of light elements is achieved by a new STEM imaging technique (e-ABF: enhanced ABF), facilitating observation of light-element materials, even at low accelerating voltages.
The microscope room is separated from the operation room to enable straightforward remote operation. In addition, JEOL products’ new concept colors of "pure white" and "JEOL silver" are adopted, leading to a sophisticated exterior design of "NEOARM".
STEM HAADF image 70 pm (200 kV), 100 pm (80 kV), 160 pm (30 kV)
Cold field emission gun (Cold FEG): standard
STEM: NEO ASCOR HOAC*2, TEM: CETCOR
Corrector auto tuning system
NEO JEOL COSMO™ Auto tuning system Ad-hock tune (SIAM) built-in
30 to 200 kV (30, 80, 200 kV: standard, 60, 120 kV: optional)
Magnetic field free mode
Lorentz lens settings (×50 to 80 k on screen): standard
Specimen movement system
X, Y and Z
*1 UHR with STEM/TEM Cs corrector configured)
*2 HOAC (Higher order aberration corrector)
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.