Transmission Electron Microscopes (TEM)

JEOL JEM-ARM1300S Transmission Electron Microscope

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JEOL JEM-ARM1300S Transmission Electron Microscope

The ARM1300S is a side-entry ultra-high-voltage microscope for in-situ imaging at the atomic level. With state-of-the-art computer controls, including remote control, it is an electron microscope of the most advanced generation.

The ARM1300S is designed for a wide application spectrum:

  • Atomic analysis of metals, inorganic materials and organic chemical compounds
  • Observation of the radiation damage to specimen before and after radiation
  • 3D imaging of thick specimen (tomography)
  • Element analyses of a full range of materials

Specifications

Electron optics

Acceleration voltage

400 to 1300 kV

Point resolution

0.12 nm

Line resolution

0.10 nm

Magnification range

x200 to max. x2,000,000

Specimen stage

Type

Side-entry goniometer

Stage movement

X: ±1 mm
Y: ±1 mm
Z: ±0.5 mm (depending on the pole piece)
T: ±60°

Options (selection)

  • In-situ observation with several specimen holders (double tilting, heating, cooling, straining, cryo-transfer, etc.)
  • Energy filtering (GATAN GIF)
  • Ion beam accelerator
    - For the analysis of radiation damage
    - For the development of new materials
    - Modifications of surface structures and characteristics

Images: © JEOL (Germany) GmbH. All rights reserved.

Please note:

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

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