Transmission Electron Microscopes (TEM)

JEOL JEM-ARM1300S Transmission Electron Microscope


JEOL JEM-ARM1300S Transmission Electron Microscope

The ARM1300S is a side-entry ultra-high-voltage microscope for in-situ imaging at the atomic level. With state-of-the-art computer controls, including remote control, it is an electron microscope of the most advanced generation.

The ARM1300S is designed for a wide application spectrum:

  • Atomic analysis of metals, inorganic materials and organic chemical compounds
  • Observation of the radiation damage to specimen before and after radiation
  • 3D imaging of thick specimen (tomography)
  • Element analyses of a full range of materials


Electron optics

Acceleration voltage

400 to 1300 kV

Point resolution

0.12 nm

Line resolution

0.10 nm

Magnification range

x200 to max. x2,000,000

Specimen stage


Side-entry goniometer

Stage movement

X: ±1 mm
Y: ±1 mm
Z: ±0.5 mm (depending on the pole piece)
T: ±60°

Options (selection)

  • In-situ observation with several specimen holders (double tilting, heating, cooling, straining, cryo-transfer, etc.)
  • Energy filtering (GATAN GIF)
  • Ion beam accelerator
    - For the analysis of radiation damage
    - For the development of new materials
    - Modifications of surface structures and characteristics

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Please note:

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

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