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09.07.2011 JEOL Q-SEM Series – Analytical Scanning Electron Microscopes
The scanning electron microscopes in the Q-SEM Series offer outstanding performance and ease of use. They were designed to meet the sophisticated quality assurance requirements both of the academic and industrial world.
08.07.2011 JEOL Spiral-TOF: Patented ion optics with the highest mass resolution available in the world
With the new Spiral TOF, JEOL offers a MALDI-TOF mass spectrometer that stands out with its extra-long spiral flight path of 17 m. In the spiral TOF the ions circulate up to 8 times in the device.
02.07.2011 JEOL MICCS-NMR: In situ real time measurement of chemical reactions in the NMR spectrometer
MICCS stands for Micro Channeled Cell for Synthesis monitoring. Up to three different substances can be mixed flawlessly in the NMR micro-flow cell and the reaction mixture can be analyzed directly in the NMR magnet.
Exhibition Dates
DPG-Frühjahrstagung
25.03. - 30.03.2012 in Berlin (TU Berlin), DeutschlandSymposium Microanalysis and Microscopy, 76. Jahrestagung der DPG/DPG Frühjahrstagung, located at TU Berlin in Berlin, Germany
analytica 2012
17.04. - 20.04.2012 in New Munich Trade Fair Centre, Munich, GermanyInternational Trade Fair for Laboratory Technology, Analysis, Biotechnology and analytica Conference
Scandem
12.06. - 15.06.2012 in Bergen, Norway63rd annual meeting of SCANDEM, the Nordic microscopy society
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