JEOL Analytical Services - Top-level analytical services
JEOL - Scanning Electron Microscopes with Thermal Field Emission Cathode

Scanning Electron Microscopes
with Thermal Field Emission Cathode

JEOL scanning electron microscopes with thermal in-lens field emission cathodes combine a small beam diameter with a high, long-term stable current.

They are therefore designed for fast, precise chemical analyses with the help of EDS and WDS for crystalo-graphic analyses (EBSD) as well as for high resolution electron beam lithography.

 
 

Models:

For additional product information, please select a model from the following list.

  • JEOL JSM-7200F Field Emission Scanning Electron Microscope

    JEOL JSM-7200F Field Emission Scanning Electron Microscope

    Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves maximum probe current of more than 300 nA.

  • JEOL JSM-7610F Field Emission Scanning Electron Microscope

    JEOL JSM-7610F Field Emission Scanning Electron Microscope

    The JEOL JSM-7610F is a field emission scanning electron microscope with a newly designed thermal field emission source. The narrow energy spread of the emitting electrons provides superb focusing capability for the electron beam and thus also enables excellent resolution.

  • JEOL JSM-7800F Field Emission Scanning Electron Microscope

    JEOL JSM-7800F Field Emission Scanning Electron Microscope

    The JEOL JSM-7800F is a field emission scanning electron microscope with a newly designed thermal field emission source. The narrow energy spread of the emitting electrons result in optimal focusing capability for the electron beam and thus also enables excellent resolution.

  • JEOL JSM-7800F PRIME - Extreme-resolution Analytical Field Emission SEM

    JEOL JSM-7800F PRIME - Extreme-resolution Analytical Field Emission SEM

    Industry-leading FE-SEM for any type of sample, any type of analysis. The JSM-7800F PRIME represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for imaging and analysis.

  • JEOL JSM-IT300HR InTouchScope™

    JEOL JSM-IT300HR InTouchScope™

    The JSM-IT300HR is the latest addition the high appreciated and award-winning JEOL InTouchScope SEM family.

 
 

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

Contact, dates and things to know

Contact

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH
Gute Änger 30
DE-85356 Freising · Germany
Phone: +49 8161 9845-0
Fax: +49 8161 9845-100
E-mail: info@jeol.de


JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB
Hammarbacken 6A
SE-19127 Sollentuna · Sweden
Phone: +46 828 2800
Fax: +46 829 1647
E-mail: info@jeol.se


Contact

Registration
Newsletter subscribe

Through the free registration you will receive a number of additional information and you have the possibility to win a voucher for our JEOL-Academy.


Login


Second-hand Equipment

 
JEM-1010
The JEM-1010 is a cost-effective and powerful high-resolution electron microscope with an acceleration voltage up to 100 kV.
JEM-1400Plus
Transmission Electron Microscope JEOL JEM-1400Plus from our applications laboratory.
IB-19510CP
Easy-to-operate preparation system for the production of specimen cross-sections for SEM, EPMA and auger applications.
JSM-IT300 LV
High-performance and multi-purpose Scanning Electron Microscopes capable of handling a variety of applications. JEOL JSM-IT300 LV from our applications laboratory.
JSM-7800F PRIME
Extreme-resolution Analytical Field Emission SEM. JEOL JSM-7800F PRIME from our applications laboratory.
 
 
 

Customer survey:
Tell us your opinion

Your opinion is important to us! Please, find time a few minutes and help us by your participation in our customer survey our service to improve even further. Of course the whole questioning is anonymous and your specifications are used only for internal evaluations.

JEOL-Seminars

Our seminars are only available in German language. Please contact us if you have questions about specific trainings and seminars.

The next seminar sessions will be held on:

No entries existent

JEOL-Academy

Our workshops and trainings are only available in German language. Please contact us if you have questions about specific trainings and seminars.

The next training sessions will be held on:

Exhibitions and Conferences

 
 
External link to website www.jeol.com

Globale Website

 
External link to Website www.jeol-arm.eu

JEOL ARM-Owner-Group

 
 
RSS
Kontakt

Contact

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH supports customers in Germany, Liechtenstein, Austria, Switzerland, Denmark and the Baltic Countries.

JEOL (Germany) GmbH
Gute Änger 30
D-85356 Freising · Germany
Phone: +49 8161 9845-0
Fax: +49 8161 9845-100
E-mail: info@jeol.de

JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB supports customers in Finland, Greenland, Iceland, Norway and Sweden.

JEOL (Nordic) AB
Hammarbacken 6A
SE-19127 Sollentuna · Sweden
Phone: +46 828 2800
Fax: +46 829 1647
E-mail: info@jeol.se

Global website

Global website

External link to website www.jeol.com

JEOL ARM-owner-group

External link to Website www.jeol-arm.eu