Cryo-electron microscopy has been established as a method to enable observation of cells and biological molecules with no fixation and no staining. Owing to the recent rapid progress of hardware and software, this microscopy technique has become increasingly important as an atomic-scale structural analysis method. In addition, technologies that enable analysis of membrane proteins without crystallization have been developed, resulting in increased use of cryo-electron microscopy for drug discovery. Thus, installation of cryo-electron microscopes (cryo-EM) in universities and research laboratories is greatly accelerating. To meet the needs of cryo-EM users, JEOL has developed a new cryo-EM “CRYO ARM™ 200 II”, which automatically acquires image data for Single Particle Analysis over a long period of time.
Electron gun | Cold field emission gun (Cold FEG) |
Accelerating voltage | 200kV |
Energy filter | In-column Omega energy filter |
Maximum specimen tilt angle | ± 70° |
※ Schottky field emission gun can optionally be configured.
Specimen stage | |
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Coolant | Liquid nitrogen |
Specimen cooling temperature | 100K or less |
Temperature measurement position | Specimen, Cryo-shield, LN2 tank |
Specimen movements | |
X、Y | Motor drive (movements: ±1 mm) |
Z | Motor drive (movements: ±0.2 mm) |
Tilt-X | Motor drive (tilts: ±70°) |
Rotation within the specimen plane | 0° or 90° |
Specimen exchange system | Air-lock |
Cooling temperature | 105K or less |
Specimen exchange cartridge | Up to 4 specimens can be changed at one time. |
Specimen parking stage | Up to 12 specimens can be held. |
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.
Keiichi Namba
Professor at the Graduate School of Frontier Biosciences, Osaka University