DE
EN
Navigation
COMPANY
COMPANY
SECTORS
Biology and biotechnology
Biology and biotechnology
Chemistry and pharmaceutics
Chemistry and pharmaceutics
Physics and basic research
Physics and basic research
Medicine and forensics
Medicine and forensics
Polymers
Polymers
Materials and semiconductors
Materials and semiconductors
Food and the environment
Food and the environment
Earth sciences, mineral resources, energy and other resources
Earth sciences, mineral resources, energy and other resources
Automotive, aviation and aerospace technology
Automotive, aviation and aerospace technology
SECTORS
Biology and biotechnology
Biology and biotechnology
Chemistry and pharmaceutics
Chemistry and pharmaceutics
Physics and basic research
Physics and basic research
Medicine and forensics
Medicine and forensics
Polymers
Polymers
Materials and semiconductors
Materials and semiconductors
Food and the environment
Food and the environment
Earth sciences, mineral resources, energy and other resources
Earth sciences, mineral resources, energy and other resources
Automotive, aviation and aerospace technology
Automotive, aviation and aerospace technology
PRODUCTS
Transmission Electron Microscopes (TEM)
Transmission Electron Microscopes (TEM)
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)
Preparation Systems
Preparation Systems
NMR spectrometer
NMR spectrometer
Mass Spectrometer
Mass Spectrometer
ESR Spectrometer
ESR Spectrometer
Electron Beam Microprobes Analyzers
Electron Beam Microprobes Analyzers
X-ray Microanalysis
X-ray Microanalysis
Focused Ion Beam Systems
Focused Ion Beam Systems
XPS and Auger Analysis
XPS and Auger Analysis
Electron Beam Lithography
Electron Beam Lithography
Second-hand Equipment
Second-hand Equipment
PRODUCTS
Transmission Electron Microscopes (TEM)
Transmission Electron Microscopes (TEM)
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)
Preparation Systems
Preparation Systems
NMR spectrometer
NMR spectrometer
Mass Spectrometer
Mass Spectrometer
ESR Spectrometer
ESR Spectrometer
Electron Beam Microprobes Analyzers
Electron Beam Microprobes Analyzers
X-ray Microanalysis
X-ray Microanalysis
Focused Ion Beam Systems
Focused Ion Beam Systems
XPS and Auger Analysis
XPS and Auger Analysis
Electron Beam Lithography
Electron Beam Lithography
Second-hand Equipment
Second-hand Equipment
SERVICES & SUPPORT
SERVICES & SUPPORT
NEWS
NEWS
CONTACT
CONTACT
Second-Hand
News
Global Site
Log in
Password forgotten?
for registration
Full-text search
Search
Please insert a search item
This website uses cookies. By using the website you agree to the use of cookies.
Privacy Information
Close