Preparation Systems
Preparation Systems

Range of application

Cross-section, polish, lamella or surface coating, from carbide sample to butterfly wing - JEOL preparation solutions are capable of overcoming even the most challenging of problems! Thanks to the fast yet careful cutting, samples are optimally prepared for perfect, artifact-free analysis. For each specific need, JEOL offers a tailor-made combination of preparation and microscopy systems.


  • Suitable for every sample type: be that hard diamond or soft butterfly wing
  • Patented solutions for artifact-free preparation
  • User-friendly operation and high degree of automation
  • Ideal addition to your high-end microscopy system

Detailed solutions

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