Electron Beam Microprobes Analyzers
Electron Beam Microprobes Analyzers

Range of application

Thanks to their combination of high-resolution electron optics and wavelength dispersive x-ray spectroscopy, JEOL electron probe microanalyzers deliver a highly sensitive, spatially resolved (trace) element analysis with very high reproducibility.

Solutions

  • Flexible electron sources (W, LaB6 or FEG)
  • Records large-scale element mapping images (mapping)
  • Very high sensitivity and energy resolution
  • Combined recording of EDX, WDX and SXES spectra
  • Light element analytics from lithium
  • Simple and intuitive operation

Detailed solutions

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