Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)

Range of application

Scanning electron microscopes are constantly opening up new fields of application in nano-technology or biology, for example. New manufacturing processes on a nanometer scale have since become so advanced that it has even become necessary to develop new SEM technologies. When resolutions in the nm to sub-nm range are required and the handling of the device thus takes on an important role, JEOL scanning electron microscopes are the first choice. Thanks to their flexibility with respect to expansion and their outstandingly long service life, JEOL instruments are the perfect quality assurance and product development solution for industry and research establishments. All JEOL SEMs can be optimally adjusted to the respective applications, enabling them to meet every demand.

Solutions

  • Product portfolio ranging from high-end field-emission device to desk-top unit
  • Ideal for every sample type and size
  • Multitude of expansion options (EDS, WDS, EBSD etc.)
  • Very long anticipated service life with low service costs
  • Easy handling
  • Perfect application concept guarantees highest level of use

Detailed solutions

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