Second-hand Equipment

A selection of JEOL second-hand equipment is listed below.
Please contact us if you have questions about specific instruments or prices.

JIB-4700F

JEOL Multi Beam System from our applications laboratory.

Additional information can be found here

Features

High resolution SEM observation
Fast analysis
High speed processing
Enhanced detection system
Versatile application spectrum
Three-dimensional observation/analysis
Compatible transfer solutions
Picture overlay system

IB-19530CP

Easy-to-operate preparation system for the production of specimen cross-sections for SEM, EPMA and auger applications.
JEOL Cross section polisher IB-19530CP from our applications laboratory

Additional information can be found here

Features

Improvements to facilitate fast and easy processing of a wide range of materials include:

High throughput: high-speed ion source and auto start function
Auto processing programs: High-speed processing and finishing, intermittent processing
Ease of setup: through modularized function holder
Multi-purpose stage for planar surface milling and polishing and ion beam sputter coating
Highly-durable shield

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Scanning Electron Microscopes (SEM) Focused Ion Beam Systems (FIB) Transmission Electron Microscopes (TEM) Sample Preparation Systems (SEM / TEM) Electron Probe Microanalyzers (EPMA) Auger Spectroscopy X-ray Photoelectron Spectroscopy (XPS/ESCA)

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