Second-hand Equipment

Second-hand Equipment

A selection of JEOL second-hand equipment is listed below.
Please contact us if you have questions about specific instruments or prices.

JIB-4700F

JEOL Multi Beam System from our applications laboratory.

Features

  • High resolution SEM observation
  • Fast analysis
  • High speed processing
  • Enhanced detection system
  • Versatile application spectrum
  • Three-dimensional observation/analysis
  • Compatible transfer solutions
  • Picture overlay system

IB-19530CP

Easy-to-operate preparation system for the production of specimen cross-sections for SEM, EPMA and auger applications.
JEOL Cross section polisher IB-19530CP from our applications laboratory

Features

Improvements to facilitate fast and easy processing of a wide range of materials include:

  • High throughput: high-speed ion source and auto start function
  • Auto processing programs: High-speed processing and finishing, intermittent processing
  • Ease of setup: through modularized function holder
  • Multi-purpose stage for planar surface milling and polishing and ion beam sputter coating
  • Highly-durable shield

Contact Form

We are happy to answer your questions at no charge and free of obligation and can offer consulting on upcoming projects. Please use the following contact form (* = mandatory field) for your questions.

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