Second-hand Equipment

Versatile, high throughput SEM from JEOL combined with the intuitive operation of a table-top SEM. Fully functional setup from our applications laboratory.

The InTouchScope JSM-IT200 features all the capabilities of a full size tungsten SEM with integrated EDS analysis in a small, ergonomic and intuitive design. It is very easy to install since neither cooling water nor gas is necessary.

Practical features for users of all levels:

• high resolution imaging in HV/LV/SE/BSE
• Zeromag-mode for intuitive transition from light-optic to SEM image
• chemical analysis with optional integrated EDS and live analysis
• multi-touch screen control and wireless operation
• automatic SEM condition setup based on sample type
• simultaneous multiple live image and movie capture
• fast sample navigation at 5x – 300,000x magnifications
• Smile View Premium with image sharpening, montaging, position alignment and overlay
• Compact floor space: ca. 0,5m²

Innovative desktop scanning electron microscope with a fully hard- and software-integrated energy-dispersive X-ray spectrometer (EDS) including a low-vacuum mode for non-conductive samples. Fully functional setup from our applications laboratory.

• “Live 3D”: real-time SEM image and reconstructed 3D surface for simultaneous acquisition of topographic depth information and surface fine structures.
• Full-featured electron optics for magnifications up to x100,000.
• Straightforward emitter change provided by pre-centered tungsten filaments.
• Automatic condition setting based on sample type and application ensures high quality results and enhances productivity.
• JEOL ZeroMag for seamless transition between light optical and SEM imaging dramatically improves handling and through-put.
• Fully integrated JEOL EDS system including live EDS for maximum ease of use and comprehensive report generation.
• Automated acquisition of SEM images and elemental distribution maps resulting in high resolution montages.
• Challenging samples can be investigated in low-vacuum mode with the push of a button.
• Large chamber for samples of up to 80 mm diameter and 50 mm height.
• Simple installation – an electric socket and you are ready to go!
• Compact design for mobile applications.

Easy-to-operate preparation system for the production of specimen cross-sections for SEM, EPMA and auger applications.
JEOL Cross section polisher IB-19530CP from our applications laboratory

Improvements to facilitate fast and easy processing of a wide range of materials include:

• High throughput: high-speed ion source and auto start function
• Auto processing programs: High-speed processing and finishing, intermittent processing
• Ease of setup: through modularized function holder
• Multi-purpose stage for planar surface milling and polishing and ion beam sputter coating
• Highly-durable shield