Never has SEM imaging been so easy: the new JCM-7000 incorporates straightforward sample navigation and advanced auto functions making it the ideal tool for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It unites SEM images, reconstructed 3D surfaces and EDS elemental analyses in real-time within an intuitive user interface. In addition, the mobile all-round talent JCM-7000 features a large sample chamber, high resolution and a low-vacuum mode for challenging samples.
×10 to 100,000 (Reference: Polaroid)
5 kV / 10 kV / 15 kV
Secondary electron detector (SE) and backscattered electron detector (BSE) in high vacuum mode, backscattered electron detector (BSE) in low vacuum mode
Tungsten source (pre-centered filaments)
2 axes motorized (X: 40 mm, Y: 40 mm)
Max. diameter: 80 mm, max. height: 50 mm
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.