The next level of analytical intelligence: Our new field emission scanning electron microscope JSM-IT800 unites both highest resolution imaging capabilities and intuitive handling for unprecedented work efficiency. Powered by a new graphical user interface, it has never been so easy to implement light optical navigation, SEM images and elemental analysis (EDS) in one intuitive workflow and report generation process. Owing to the patented In-Lens Schottky Plus technology, the microscope not only facilitates imaging of sensitive samples with high resolution at low dose conditions but also delivers highest beam currents for ultra-fast microanalysis.
With these properties, the new JSM-IT800 covers a broad range of applications and ensures minimum time-to-result even for novice users.
HL | SHL | |
---|---|---|
Secondary electron image resolution | 0.7 nm(Accelerating voltage 20 kV) | 0.5 nm(Accelerating voltage 15 kV) |
Magnification | ×10 to 1,000,000 (Polaroid) | ×10 to 2,000,000 (Polaroid) |
Accelerating voltage | 0.01 to 30 kV | 0.01 to 30 kV |
Probe current | A few pA to ≥ 300 nA | A few pA to ≥ 500 nA |
Electron Gun | In-lens Schottky field emission electron gun | In-lens Schottky field emission electron gun |
Specimen stage | Fully eucentric goniometer stage | Fully eucentric goniometer stage |
Specimen exchange | One-action exchange mechanism available | One-action exchange mechanism available |
Electron detector system | In-lens detector with integrated filter, Everhart Thornley detector, Options: Retractable BSE detectors, STEM detectors and others | In-lens detector, Everhart Thornley detector, Options: Filtered in-lens detection, retractable BSE detectors, STEM detectors and others |
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.