JEOL IB-19530CP Cross Section Polisher
JEOL IB-19530CP Cross Section Polisher
The JEOL IB-19530CP, a cross-section specimen preparation instrument, was first commercialized in 2003 and has become a market leader and one of JEOL’s best-selling products with cumulative sales of over 1,600 units.
With Utilizing a broad argon ion beams and a shield plate, the JEOL IB-19530CP can prepare smoother cross sections with less distortion deformation in comparisonas compared with generalto the more traditional mechanical polishing methods. These features have made the JEOL IB-19530CP an instrument of choice for preparation of a variety of specimens (from paper and polymers to microelectronics and superalloys) widely used in broad applications for the preparation of specimens to be used analyzed with a scanning electron microscope, an electron-probe microanalyzer or an Auger microprobe.
The innovative design of the JEOL IB-19530CP features a newly developed, multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by using different kinds of function holders. The multi-purpose stage combined with specialized functional holders allows the user to perform a plethora of functions, such as planar surface milling and polishing, sputter coating as well as more traditional cross-section ion milling.
Moreover, the highly durable shield plate of the IB-19530CP can reduce maintenance costs by about 50% as compared with conventional models.
The JEOL IB-19530CP has now evolved to meet broader needs at affordable cost.
Features
- High throughput
The high-speed ion source and auto start function deliver milling results quickly. - Auto processing program
High-speed processing and finishing can be programmed to achieve high quality cross sections in a short period of time. Intermittent processing can also be programmed to enhance preparation of low melting temperature and ion beam sensitive materials. - Ease of setup
The modularized function holder allows correct ROI adjustment either inside the IB-19530CP or by utilizing an external optical microscope. - Multi-purpose stage
Additional functions including planar surface milling and ion beam sputter coating can be utilized via a variety of holders. - Highly-durable shield
The shield plate is about three times as durable as conventional products, which allows for a higher processing rate and longer lifetime.
Specifications
Ion accelerating voltage | 2～8kV |
Milling speed | 500μm/h |
Max. specimen size | 11mm (W) x 10mm (L) x 2mm (T) |
Specimen swing function | Automatic swing of specimen during milling by ± 30° |
Auto start mode | Processing is automatically started once a preset pressure value is reached |
Intermittent mode | Pulse-controlled ion beam radiation reduces ion beam specimen exposure during processing |
Finishing mode | Fine surface finish milling is automatically started once processing is completed |
Please note:
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.