The JEOL IB-19530CP, a cross-section specimen preparation instrument, was first commercialized in 2003 and has become a market leader and one of JEOL’s best-selling products with cumulative sales of over 1,600 units.
With Utilizing a broad argon ion beams and a shield plate, the JEOL IB-19530CP can prepare smoother cross sections with less distortion deformation in comparisonas compared with generalto the more traditional mechanical polishing methods. These features have made the JEOL IB-19530CP an instrument of choice for preparation of a variety of specimens (from paper and polymers to microelectronics and superalloys) widely used in broad applications for the preparation of specimens to be used analyzed with a scanning electron microscope, an electron-probe microanalyzer or an Auger microprobe.
The innovative design of the JEOL IB-19530CP features a newly developed, multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by using different kinds of function holders. The multi-purpose stage combined with specialized functional holders allows the user to perform a plethora of functions, such as planar surface milling and polishing, sputter coating as well as more traditional cross-section ion milling.
Moreover, the highly durable shield plate of the IB-19530CP can reduce maintenance costs by about 50% as compared with conventional models.
The JEOL IB-19530CP has now evolved to meet broader needs at affordable cost.
Ion accelerating voltage
Max. specimen size
11mm (W) x 10mm (L) x 2mm (T)
Specimen swing function
Automatic swing of specimen during milling by ± 30°
Auto start mode
Processing is automatically started once a preset pressure value is reached
Pulse-controlled ion beam radiation reduces ion beam specimen exposure during processing
Fine surface finish milling is automatically started once processing is completed
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